Random errors in MOS capacitors
- 1 December 1982
- journal article
- Published by Institute of Electrical and Electronics Engineers (IEEE) in IEEE Journal of Solid-State Circuits
- Vol. 17 (6), 1070-1076
- https://doi.org/10.1109/jssc.1982.1051862
Abstract
No abstract availableThis publication has 2 references indexed in Scilit:
- Matching properties, and voltage and temperature dependence of MOS capacitorsIEEE Journal of Solid-State Circuits, 1981
- A two-stage weighted capacitor network for D/A-A/D conversionIEEE Journal of Solid-State Circuits, 1979