Excess and Thermal Currents in Gallium Arsenide Esaki Diodes
- 1 November 1964
- journal article
- Published by IOP Publishing in Japanese Journal of Applied Physics
- Vol. 3 (11)
- https://doi.org/10.1143/jjap.3.711
Abstract
The exponential excess current and the thermal current in GaAs Esaki diodes have been studied in the temperature range 77° to 350°K. The exponential excess current is observable in a typical sample up to bias voltages of 1.2 V and 1.4 V at room and liquid nitrogen temperatures, respectively. The existence of an exponential excess current in such a wide bias range requires an almost uniform distribution of intermediate states throughout the energy gap in the vicinity of a junction. The lattice defects of a high concentration should be responsible for the intermediate states. The thermal current in GaAs Esaki diodes is believed to be a high-injection current but not the usual diffusion current.Keywords
This publication has 15 references indexed in Scilit:
- Theoretical and experimental analysis of germanium tunnel diode characteristicsSolid-State Electronics, 1964
- Properties of GaAs alloy diodesSolid-State Electronics, 1963
- Deterioration-Induced Slow Trap in GaAs Esaki DiodesJapanese Journal of Applied Physics, 1963
- Optical Transitions Involving Impurities in SemiconductorsPhysical Review B, 1963
- Electron-Hole and Electron-Impurity Band Tunneling in GaAs Luminescent JunctionsPhysical Review Letters, 1963
- Properties of theMesonPhysical Review Letters, 1962
- Degenerate Germanium. I. Tunnel, Excess, and Thermal Current in Tunnel DiodesPhysical Review B, 1962
- Electronic Processes and Excess Currents in Gold-Doped Narrow Silicon JunctionsPhysical Review B, 1961
- Electron Bombardment Damage in Silicon Esaki DiodesJournal of Applied Physics, 1961
- Fast Neutron Bombardment of Germanium and Silicon Esaki DiodesJournal of Applied Physics, 1960