Energy straggling ofparticles in solid materials
- 1 June 1976
- journal article
- research article
- Published by American Physical Society (APS) in Physical Review A
- Vol. 13 (6), 2042-2048
- https://doi.org/10.1103/physreva.13.2042
Abstract
The energy straggling of 0.5-, 1.0-, 1.5-, and 2.0-MeV particles in thin vapor-deposited films of Ti, Cr, Co, Cu, and Ag onto a thick substrate has been measured to ±6% by an elastic scattering technique using a magnetic spectrometer. The measurements reveal a linear versus target thickness dependence and a mild increase with energy for a fixed target thickness. When is plotted as a function of , a decrease in energy straggling with increasing atomic number is observed, although it is considerably higher than predicted by the Bonderup-Hvelplund modification of the Lindhard statistical approach.
Keywords
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