Growth and characterization of Cd1−xZnxTe and Hg1−yZnyTe
- 1 January 1988
- journal article
- Published by Elsevier in Journal of Crystal Growth
- Vol. 86 (1-4), 93-99
- https://doi.org/10.1016/0022-0248(90)90704-o
Abstract
No abstract availableKeywords
This publication has 6 references indexed in Scilit:
- Photoreflectance study of Hg0.7Cd0.3Te and Cd1−xZnxTe: E1 transitionJournal of Vacuum Science & Technology A, 1986
- Optoelectronic properties of Cd1−xZnxTe films grown by molecular beam epitaxy on GaAs substratesApplied Physics Letters, 1985
- Evidence for bond strengthening in Cd1−xZnxTe (x=0.04)Applied Physics Letters, 1985
- Effects influencing the structural integrity of semiconductors and their alloysJournal of Vacuum Science & Technology A, 1985
- Study of mercury cadmium telluride (MCT) surfaces by automatic spectroscopic ellipsometry (ASE) and by electrolyte electroreflectance (EER)Journal of Vacuum Science & Technology A, 1985
- Measurement of impurities in a multi-doped sample of cadmium mercury tellurideJournal of Electronic Materials, 1983