X-Ray Interferometric Solution of the Surface Registration Problem
- 6 February 1984
- journal article
- research article
- Published by American Physical Society (APS) in Physical Review Letters
- Vol. 52 (6), 441-444
- https://doi.org/10.1103/physrevlett.52.441
Abstract
A Bonse-Hart x-ray interferometer was used to determine the (220) Fourier component of the distribution function of a chemisorbed submonolayer of bromine on a (111) silicon surface. This measurement demonstrates not only the presence of an x-ray interference field above the crystal surface of the analyzer of a Laue-case interferometer, but when coupled with Bragg-case standing-wave measurements also provides the means to determine uniquely the position of surface atoms relative to the bulk lattice.Keywords
This publication has 8 references indexed in Scilit:
- Solution to the Surface Registration Problem Using X-Ray Standing WavesPhysical Review Letters, 1982
- X-Ray Standing Waves at Crystal SurfacesPhysical Review Letters, 1980
- Perfect-crystal monochromators for synchrotron X-radiationJournal of Applied Crystallography, 1976
- Observation of internal x-ray wave fields during Bragg diffraction with an application to impurity lattice locationPhysical Review B, 1974
- Detection of Foreign Atom Sites by Their X-Ray Fluorescence ScatteringPhysical Review Letters, 1969
- AN X-RAY INTERFEROMETERApplied Physics Letters, 1965
- Principles and design of Laue-case X-Ray interferometersThe European Physical Journal A, 1965
- Effect of Dynamical Diffraction in X-Ray Fluorescence ScatteringPhysical Review B, 1964