Two calculation procedures for the determination of composition and mass thickness of thin samples by x-ray spectrometry
- 31 December 1982
- journal article
- research article
- Published by Elsevier in Analytica Chimica Acta
- Vol. 136, 379-384
- https://doi.org/10.1016/s0003-2670(01)95400-5
Abstract
No abstract availableKeywords
This publication has 4 references indexed in Scilit:
- Versatile x-ray analysis program combining fundamental parameters and empirical coefficientsAnalytical Chemistry, 1978
- Mass thickness measurement of pure element films by X-ray fluorescence spectroscopyX-Ray Spectrometry, 1977
- Simultaneous determination of composition and mass thickness of thin films by quantitative x-ray fluorescence analysisAnalytical Chemistry, 1977
- Spectral distributions of X-rays produced by a general electric EA 75 Cr/W tube at various applied constant voltagesX-Ray Spectrometry, 1976