High-Frequency Resistance of Photoconducting Films

Abstract

Measurements of high-frequency (hf) resistance and photoconductivity have been performed on PbTe infrared photocells, and interpreted in the light of a recent analysis of hf resistance of thin films. Hf data show the presence of macroscopic nonuniformity in the photoconducting layers which decreases upon illumination. Since this technique will not detect the presence of inter crystallite barriers, their action in photoconductivity can neither be proved nor disproved by this method.