A Reparable Multistate Device
- 1 April 1979
- journal article
- Published by Institute of Electrical and Electronics Engineers (IEEE) in IEEE Transactions on Reliability
- Vol. R-28 (1), 81-82
- https://doi.org/10.1109/tr.1979.5220490
Abstract
A device that can assume several states of failure is called a multistate device. Closed form solutions for both the steady-state and time-dependent availability of such a device and probability of failure in state i at any given time t are developed, largely in Laplace Transform form.Keywords
This publication has 3 references indexed in Scilit:
- A preliminary research on risk management for marine industry applicationsPublished by Institute of Electrical and Electronics Engineers (IEEE) ,2012
- A Reparable 3-State DeviceIEEE Transactions on Reliability, 1976
- The graphical reliability evaluation of three-state device networksMicroelectronics Reliability, 1975