Secondary-ion mass spectrometry (SIMS) analysis of electron-bombarded soda-lime-silica glass
- 1 April 1979
- journal article
- Published by AIP Publishing in Applied Physics Letters
- Vol. 34 (7), 444-446
- https://doi.org/10.1063/1.90828
Abstract
Al‐coated glasses of molar composition 20Na2O‐10CaO‐70SiO2 have been bombarded with a rastered beam of either 7‐ or 10‐keV electrons. SIMS analysis of these glasses indicates a near‐surface layer deficient in Na, bounded by a steep rise of the Na signal. The thickness of this layer increases with electron‐bombardment time until it becomes close to the expected maximum range of electron penetration. No Ca displacement was observed. Below the Na‐deficient layer, a layer containing uncombined Na was found.Keywords
This publication has 9 references indexed in Scilit:
- SIMS Analysis of Aqueous Corrosion Profiles in Soda‐Lime‐Silica GlassJournal of the American Ceramic Society, 1979
- SIMS Analysis of a Field‐Assisted Glass‐to‐Metal SealJournal of the American Ceramic Society, 1978
- Depth profiling of sodium in SiO2 films by secondary ion mass spectrometryApplied Physics Letters, 1978
- Charging of insulators by ion bombardment and its minimization for secondary ion mass spectrometry (SIMS) measurementsJournal of Applied Physics, 1976
- A new method for the determination of the penetration depth of electrons in insulatorsPhysica Status Solidi (a), 1973
- Characterization of Silicon Dioxide Films by the Electron ProbeJournal of the Electrochemical Society, 1971
- Electron-Probe Microanalysis of Alkali Metals in GlassesJournal of Applied Physics, 1969
- Oxygen Outgassing Caused by Electron Bombardment of GlassJournal of Applied Physics, 1963
- Outgassing Caused by Electron Bombardment of GlassJournal of Applied Physics, 1960