Statistical analysis for practical circuit design
- 1 February 1975
- journal article
- Published by Institute of Electrical and Electronics Engineers (IEEE) in IEEE Transactions on Circuits and Systems
- Vol. 22 (2), 100-108
- https://doi.org/10.1109/tcs.1975.1084010
Abstract
No abstract availableKeywords
This publication has 8 references indexed in Scilit:
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- Modeling for computation of IC-gate yield from processing dataPublished by Institute of Electrical and Electronics Engineers (IEEE) ,1972
- Statistical analysis of propagation delay in digital integrated circuitsPublished by Institute of Electrical and Electronics Engineers (IEEE) ,1972
- Statistical Circuit Design: Characterization and Modeling for Statistical DesignBell System Technical Journal, 1971
- Statistical Circuit Design: Nonlinear Circuits and Statistical DesignBell System Technical Journal, 1971
- An Interactive Computer Approach to Tolerance AnalysisIEEE Transactions on Computers, 1970
- Correlation of diffusion process variations with variations in electrical parameters of bipolar transistorsProceedings of the IEEE, 1969
- Computer-aided transistor design, characterization, and optimizationProceedings of the IEEE, 1967