The Si(001)/SiO2 interface
- 1 January 1990
- journal article
- Published by Elsevier in Applied Surface Science
- Vol. 41-42, 365-371
- https://doi.org/10.1016/0169-4332(89)90086-x
Abstract
No abstract availableThis publication has 7 references indexed in Scilit:
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- Effect of processing on the structure of the Si/SiO2 interfaceApplied Physics Letters, 1988
- X-ray scattering studies of the Si-interfacePhysical Review Letters, 1988
- Si→transformation: Interfacial structure and mechanismPhysical Review Letters, 1987
- The localization and crystallographic dependence of Si suboxide species at the SiO2/Si interfaceJournal of Applied Physics, 1987
- Surface roughness at the Si(100)-interfacePhysical Review B, 1985
- The crystal structure at 220°C of orthorhombic high tridymite from the Steinbach meteoriteActa Crystallographica, 1967