Infra-red interference measurements on oxide films on zirconium
- 31 December 1964
- journal article
- Published by Elsevier in Corrosion Science
- Vol. 4 (1-4), 17-24
- https://doi.org/10.1016/0010-938x(64)90004-6
Abstract
No abstract availableKeywords
This publication has 7 references indexed in Scilit:
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- Thickness Measurement of Epitaxial Films by the Infrared Interference MethodJournal of the Electrochemical Society, 1962
- The Effect of Electrolyte Composition on the Anodic Oxidation of ZirconiumJournal of the Electrochemical Society, 1962
- Interference Method for Measuring the Thickness of Epitaxially Grown FilmsJournal of Applied Physics, 1961
- Kinetics of formation of anodic oxide films on zirconiumTransactions of the Faraday Society, 1959
- Préparation de gros cristaux de zirconium et détermination de l’orientation des précipités d’hydrure de zirconiumRevue de Métallurgie, 1958
- On the mechanism of oxide film formation on zirconiumJournal of Physics and Chemistry of Solids, 1958