Laser probing of thermal behaviour of electronic components and its application in quality and reliability testing
- 31 March 1994
- journal article
- Published by Elsevier in Microelectronic Engineering
- Vol. 24 (1-4), 411-420
- https://doi.org/10.1016/0167-9317(94)90093-0
Abstract
No abstract availableKeywords
This publication has 4 references indexed in Scilit:
- Thermoreflectance optical test probe for the measurement of current‐induced temperature changes in microelectronic componentsQuality and Reliability Engineering International, 1993
- Thermal and plasma wave depth profiling in siliconApplied Physics Letters, 1985
- Detection of thermal waves through optical reflectanceApplied Physics Letters, 1985
- Temperature dependence of the optical properties of siliconJournal of Applied Physics, 1979