Functional features of a 500 kV electron microscope
- 1 September 1967
- journal article
- Published by IOP Publishing in Journal of Scientific Instruments
- Vol. 44 (9), 747-754
- https://doi.org/10.1088/0950-7671/44/9/326
Abstract
No abstract availableThis publication has 9 references indexed in Scilit:
- Electron optical properties of three-electrode electron lensesJournal of Scientific Instruments, 1966
- Energy Dependence of Extinction Distance and Transmissive Power for Electron Waves in CrystalsJournal of Applied Physics, 1964
- Work Hardening and Dislocation Arrangement of fcc Single Crystals. II. Electron Microscope Transmission Studies of Ni–Co Single Crystals and Relation to Work-Hardening TheoryJournal of Applied Physics, 1963
- Rearrangements of dislocations in stainless steel during electropolishingPhilosophical Magazine, 1963
- Construction of 300 KV Electron Microscope and Its ElectronmicroscopyJapanese Journal of Applied Physics, 1963
- On the loss of dislocations during the preparation of a thin filmPhilosophical Magazine, 1962
- An electrostatic-magnetic alinement section for the electron microscopeJournal of Scientific Instruments, 1958
- The Magnetic Electron Microscope Objective: Contour Phenomena and the Attainment of High Resolving PowerJournal of Applied Physics, 1947
- Über optische Kenngrößen starker ElektronenlinsenThe European Physical Journal A, 1941