X-Ray Diffraction Study on YBa2Cu3O7-δ Epitaxial Thin Film Grown by an Activated Reactive Evaporation Method
- 1 October 1988
- journal article
- Published by IOP Publishing in Japanese Journal of Applied Physics
- Vol. 27 (10A), L1899
- https://doi.org/10.1143/jjap.27.l1899
Abstract
The as-grown epitaxial thin film of YBa2Cu3O7-δ with T c∼90 K on a (001) SrTiO3 substrate is investigated by means of X-ray diffraction. It is clearly shown that the c-axis is perpendicular to the SrTiO3 (001) plane and no evidence of a-axis normal appears. Microtwin structures are observed, indicating that the crystal is orthorhombic. The domain size and mosaic spread are also reported.Keywords
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