Obsidian Hydration Profiles Measured by Sputter-Induced Optical Emission
- 28 July 1978
- journal article
- other
- Published by American Association for the Advancement of Science (AAAS) in Science
- Vol. 201 (4353), 339-341
- https://doi.org/10.1126/science.201.4353.339
Abstract
The variation of concentrations of hydrogen, sodium, potassium, lithium, calcium, magnesium, silicon, and aluminum as a function of depth in the hydration layer of obsidian artifacts has been determined by sputter-induced optical emission. The surface hydration is accompanied by dealkalization, and there is a buildup of alkaline earths, calcium and magnesium in the outermost layers. These results have clarified the phenomena underlying the obsidian hydration dating technique.Keywords
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