Spectral shape analysis of infrared absorption of thermally grown silicon dioxide films
- 1 June 1997
- journal article
- Published by Elsevier in Applied Surface Science
- Vol. 117-118, 216-220
- https://doi.org/10.1016/s0169-4332(97)80082-7
Abstract
No abstract availableThis publication has 14 references indexed in Scilit:
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