Correlation of trap generation to charge-to-breakdown (Q/sub bd/): a physical-damage model of dielectric breakdown
- 1 January 1994
- journal article
- Published by Institute of Electrical and Electronics Engineers (IEEE) in IEEE Transactions on Electron Devices
- Vol. 41 (9), 1595-1602
- https://doi.org/10.1109/16.310111
Abstract
No abstract availableThis publication has 27 references indexed in Scilit:
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