Growth of CdSxSe1−x thin films by laser evaporation deposition

Abstract
Optical quality thin films of CdSxSe1−x were deposited on quartz for various values of x. It was found that these films were polycrystalline in structure, with a high degree of orientation of the c axis. An empirical relationship between the band gap and the lattice constant for the binary system CdS‐CdSe was also obtained.