Diffusion processes in thin films
- 1 October 1980
- journal article
- Published by Elsevier in Thin Solid Films
- Vol. 72 (3), 399-418
- https://doi.org/10.1016/0040-6090(80)90524-6
Abstract
No abstract availableThis publication has 41 references indexed in Scilit:
- Tracer self-diffusion and electromigration in thin tin filmsJournal of Applied Physics, 1976
- Special aspects of diffusion in thin filmsThin Solid Films, 1975
- Lateral self-diffusion and electromigration in thin metal filmsThin Solid Films, 1975
- On the direct measurement of diffusion at temperatures less than 0.5 TmThin Solid Films, 1975
- Grain-boundary solute electromigration in polycrystalline filmsJournal of Applied Physics, 1974
- Self-Diffusion along Dislocations in Single-Crystal Au FilmsPhysical Review B, 1973
- Electromigration in Thin FilmsPublished by Elsevier ,1973
- Grain-boundary diffusionProgress in Materials Science, 1972
- On measurements of self‐diffusion rates along dislocations in F.C.C. MetalsPhysica Status Solidi (b), 1970
- Influence of dislocations on diffusion kinetics in solids with particular reference to the alkali halidesTransactions of the Faraday Society, 1961