Reflection X-ray topography of ZnO thin films on non-orienting substrates
- 1 January 1981
- journal article
- Published by Elsevier in Thin Solid Films
- Vol. 76 (1), 83-88
- https://doi.org/10.1016/0040-6090(81)90069-9
Abstract
No abstract availableKeywords
This publication has 5 references indexed in Scilit:
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- Controlled texture of reactively rf-sputtered ZnO thin filmsJournal of Applied Physics, 1978
- Zinc-oxide thin-film surface-wave transducersProceedings of the IEEE, 1976
- X-ray characterization of stresses and defects in thin films and substratesThin Solid Films, 1976
- Method for the Study of Lattice Inhomogeneities Combining X-Ray Microscopy and Diffraction AnalysisJournal of Applied Physics, 1956