Electron dissociative attachment rate constants for F2 and NF3 at 300 and 500 °K
- 15 December 1979
- journal article
- research article
- Published by AIP Publishing in Applied Physics Letters
- Vol. 35 (12), 920-922
- https://doi.org/10.1063/1.91005
Abstract
Electron attachment to F2 and NF3 has been studied in an electron‐beam‐controlled gas‐discharge apparatus over a range of E/P (2–10 kV/cm atm). These experiments were performed in gas mixtures containing small amounts of the halide molecules (≲1%) in an atmosphere of N2 which was included to control the average electron energy. We obtained values for the rate constants for dissociative attachment to F2 and NF3 as a function of mixture temperature at 300 and 500 °K and applied electric field. These results compare favorably with the rate constants deduced from the absolute cross section for these compounds reported by Chantry.Keywords
This publication has 13 references indexed in Scilit:
- Improvement in XeF laser efficiency at elevated temperaturesApplied Physics Letters, 1979
- Dissociative attachment of electrons to F2Applied Physics Letters, 1978
- Rare gas fluoride lasersIEEE Journal of Quantum Electronics, 1978
- Dissociative attachment of electrons to F2Applied Physics Letters, 1977
- Xenon fluoride laser excitation by transverse electric dischargeApplied Physics Letters, 1976
- Electron-beam-controlled discharge pumping of the KrF laserApplied Physics Letters, 1975
- 354-nm laser action on XeFApplied Physics Letters, 1975
- Stimulated emission at 281.8 nm from XeBrApplied Physics Letters, 1975
- Recombination rate measurements in nitrogenThe Journal of Chemical Physics, 1973
- Determination of Momentum Transfer and Inelastic Collision Cross Sections for Electrons in Nitrogen Using Transport CoefficientsPhysical Review B, 1964