Confirmation of the EPR identification of in -type Cr-doped GaAs by means of applied uniaxial stress
- 15 August 1982
- journal article
- research article
- Published by American Physical Society (APS) in Physical Review B
- Vol. 26 (4), 2296-2297
- https://doi.org/10.1103/physrevb.26.2296
Abstract
Uniaxial stress has been used to study the isotropic Cr-related EPR center in -type GaAs: Cr. Stress linearly splits the EPR line into two components, showing that the center is due to substitutional rather than interstitial . The stress coefficients are and [in units of /(dyn/)], with only relative signs known.
Keywords
This publication has 7 references indexed in Scilit:
- New EPR data for chromium in electron-irradiated p-type GaAs: the observation of Cr complexesJournal of Physics C: Solid State Physics, 1981
- Interpretation of luminescence in GaAs : Cr : 0.839 eV and 0.574 eV linesJournal de Physique, 1981
- New EPR data and photoinduced changes in GaAs: Cr. Reinterpretation of the "second-acceptor" state asPhysical Review B, 1980
- GaAs:—an orthorhombic Jahn-Teller center with a stress-dependent reorientation ratePhysical Review B, 1980
- Chromium as a hole trap in GaP and GaAsApplied Physics Letters, 1980
- Effects of uniaxial stress and temperature variation on thecenter in GaAsPhysical Review B, 1979
- Effect of Uniaxial Stresses on the Paramagnetic Spectra ofandin MgOPhysical Review B, 1964