Method of preparing Si and Ge specimens for examination by transmission electron microscopy
- 1 September 1962
- journal article
- Published by IOP Publishing in British Journal of Applied Physics
- Vol. 13 (9), 446-448
- https://doi.org/10.1088/0508-3443/13/9/303
Abstract
No abstract availableThis publication has 3 references indexed in Scilit:
- Sample Preparation for Transmission Electron Microscopy of GermaniumReview of Scientific Instruments, 1961
- The preparation of thin films of germanium and siliconBritish Journal of Applied Physics, 1961
- Selected-area diffraction in the electron microscopeBritish Journal of Applied Physics, 1960