Photoconductivity measurements related to intersubband transitions in silicon MOSFET structures
- 1 May 1978
- journal article
- Published by Elsevier in Surface Science
- Vol. 73, 207-216
- https://doi.org/10.1016/0039-6028(78)90491-0
Abstract
No abstract availableThis publication has 9 references indexed in Scilit:
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