Comparative analysis of the RF and noise performance of bulk and single-gate ultra-thin SOI MOSFETs by numerical simulation
- 30 April 2004
- journal article
- Published by Elsevier in Solid-State Electronics
- Vol. 48 (4), 543-549
- https://doi.org/10.1016/j.sse.2003.09.022
Abstract
No abstract availableKeywords
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