Surface-state densities on clean semiconductor surfaces measured by ellipsometry
- 15 April 1974
- journal article
- research article
- Published by American Physical Society (APS) in Physical Review B
- Vol. 9 (8), 3622-3626
- https://doi.org/10.1103/physrevb.9.3622
Abstract
Ellipsometric measurements of chemical adsorption reactions on clean semiconductor surfaces yield information on the change in surface-state densities due to the adsorbed layer. The results can be compared directly with those obtained by photoemission experiments.Keywords
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