Single-electron measurements with a micromechanical resonator
- 19 September 2001
- journal article
- research article
- Published by American Physical Society (APS) in Physical Review A
- Vol. 64 (4), 042318
- https://doi.org/10.1103/physreva.64.042318
Abstract
A mechanical electroscope based on a change in the resonant frequency of a cantilever one micron in size in the presence of charge has recently been fabricated. We derive the decoherence rate of a charge superposition during measurement with such a device using a master equation theory adapted from quantum optics. We also investigate the information produced by such a measurement, using a quantum trajectory approach. Such instruments could be used in mesoscopic electronic systems, and future solid-state quantum computers, so it is useful to know how they behave when used to measure quantum superpositions of charge.Keywords
All Related Versions
This publication has 14 references indexed in Scilit:
- Quantum superposition of distinct macroscopic statesNature, 2000
- Single-spin measurement using single-electron transistors to probe two-electron systemsPhysical Review B, 2000
- Continuous quantum measurement of a double dotPhysical Review B, 1999
- Coherent control of macroscopic quantum states in a single-Cooper-pair boxNature, 1999
- A silicon-based nuclear spin quantum computerNature, 1998
- Quantum computation in quantum-Hall systemsPhysics Letters A, 1998
- A nanometre-scale mechanical electrometerNature, 1998
- The quantum-jump approach to dissipative dynamics in quantum opticsReviews of Modern Physics, 1998
- Quantum computation with quantum dotsPhysical Review A, 1998
- Strong damping and low-temperature anomalies for the harmonic oscillatorPhysical Review A, 1985