The Hall and drift mobilities in thin polycrystalline semiconductor films
- 1 May 1979
- journal article
- Published by Elsevier in Thin Solid Films
- Vol. 59 (3), 279-290
- https://doi.org/10.1016/0040-6090(79)90437-1
Abstract
No abstract availableKeywords
This publication has 16 references indexed in Scilit:
- The carrier concentration in thin polycrystalline films as a function of crystalline sizeThin Solid Films, 1977
- Influence of tunnelling through barriers on grain boundaries on hole mobility in polycrystalline tellurium filmsPhysica Status Solidi (a), 1977
- Electrical conductivity of polycrystalline semiconductorsThin Solid Films, 1976
- Barrier-limited conductivity in thin film transistorsThin Solid Films, 1976
- Barrier-limited mobility in thin semiconductor filmsThin Solid Films, 1973
- The Use of the Size Effect Theory in the Transport Theory of Disordered StructuresPhysica Status Solidi (b), 1973
- Hall effect in thin CdSe filmsPhysica Status Solidi (a), 1971
- ELECTRICAL RESISTIVITY MODEL FOR POLYCRYSTALLINE FILMS: THE CASE OF SPECULAR REFLECTION AT EXTERNAL SURFACESApplied Physics Letters, 1969
- Magnetoreflection Experiments in IntermetallicsJournal of Applied Physics, 1961
- Theory of Photoconductivity in Semiconductor FilmsPhysical Review B, 1956