Reliability and Performance of Error-Correcting Memory and Register Arrays
- 1 October 1980
- journal article
- Published by Institute of Electrical and Electronics Engineers (IEEE) in IEEE Transactions on Computers
- Vol. C-29 (10), 920-927
- https://doi.org/10.1109/tc.1980.1675475
Abstract
A brief survey of memory chip failure modes shows that partial chip failures are the dominant failure mode. A single error-correcting (SEC) code memory model is developed based on the results of the survey. The effect of memory support circuitry, often ignored, is included. Examples illustrate that the support circuitry dominates the memory system reliability for wide ranges of memory system parameters.Keywords
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