Diffraction from multilayer films with partially correlated interfacial roughness
- 15 November 1992
- journal article
- Published by AIP Publishing in Journal of Applied Physics
- Vol. 72 (10), 4627-4633
- https://doi.org/10.1063/1.352116
Abstract
No abstract availableKeywords
This publication has 8 references indexed in Scilit:
- X-ray diffraction determination of interfacial roughness correlation in SixGe1−x/Si and GaAs/AlxGa1−xAs superlatticesApplied Physics Letters, 1992
- X-ray scattering from interfacial roughness in multilayer structuresJournal of Applied Physics, 1992
- Interfacial roughness correlation in multilayer films: Influence of total film and individual layer thicknessesJournal of Applied Physics, 1992
- Nonspecular x-ray scattering from multilayer structuresJournal of Applied Physics, 1991
- Determination of roughness correlations in multilayer films for x-ray mirrorsJournal of Applied Physics, 1991
- Non-equilibrium roughening transitionsJournal of Physics A: General Physics, 1989
- X-ray and neutron scattering from rough surfacesPhysical Review B, 1988
- The surface statistics of a granular aggregateProceedings of the Royal Society of London. Series A. Mathematical and Physical Sciences, 1982