Ballistic electron magnetic microscopy: Imaging magnetic domains with nanometer resolution
- 16 August 1999
- journal article
- research article
- Published by AIP Publishing in Applied Physics Letters
- Vol. 75 (7), 1001-1003
- https://doi.org/10.1063/1.124578
Abstract
A variation of ballistic electron emission microscopy has been developed to image magnetic structure in thin-film multilayers with nanometer resolution. In studies of nominally uncoupled Co/Cu/Co trilayer films, magnetic domains and domain-wall motion are readily observable with this technique. In the Co/Cu/Co trilayer system magnetic domains are found to occur on an ∼500-nm-length scale and less, while smaller-scale fluctuations in the ballistic electron transport properties of the system are found on an ∼10 nm length scale.Keywords
This publication has 11 references indexed in Scilit:
- Observation of Antiparallel Magnetic Order in Weakly Coupled Co/Cu MultilayersPhysical Review Letters, 1999
- Composition-driven change of the magnetic anisotropy of ultrathin Co/Au(111) films studied by means of magnetic-force microscopy in ultrahigh vacuumPhysical Review B, 1999
- Perpendicular giant magnetoresistance of magnetic multilayersAdvances in Physics, 1997
- Spin-dependent interface transmission and reflection in magnetic multilayers (invited)Journal of Applied Physics, 1996
- Giant Magnetoresistance in Magnetic NanostructuresAnnual Review of Materials Science, 1995
- Ballistic-electron emission microscopy (BEEM): studies of metal/semiconductor interfaces with nanometer resolutionPhysics Reports, 1995
- Oscillatory magnetic exchange coupling through thin copper layersPhysical Review Letters, 1991
- Hydrogen-terminated silicon substrates for low-temperature molecular beam epitaxyThin Solid Films, 1989
- Direct investigation of subsurface interface electronic structure by ballistic-electron-emission microscopyPhysical Review Letters, 1988
- Electrons in transition metalsAdvances in Physics, 1964