Single Te films and Te trilayers for optical recording
- 1 July 1979
- journal article
- research article
- Published by AIP Publishing in Applied Physics Letters
- Vol. 35 (1), 81-83
- https://doi.org/10.1063/1.90901
Abstract
The optical‐recording characteristics of Te‐trilayer structures are compared to those of single Te films on PMMA substrates. The results demonstrate that the single Te films are more sensitive using optical pulses ranging from 25 to 500 nsec, with otherwise identical recording and readout characteristics. A thermal analysis of the optical structures confirms such a sensitivity behavior.Keywords
This publication has 2 references indexed in Scilit:
- High-performance Te trilayer for optical recordingApplied Physics Letters, 1979
- Antireflection structures for optical recordingIEEE Journal of Quantum Electronics, 1978