Reliability of InGaAs Photodiodes for SL Applications
- 1 March 1985
- journal article
- website
- Published by Institute of Electrical and Electronics Engineers (IEEE) in AT&T Technical Journal
- Vol. 64 (3), 861-882
- https://doi.org/10.1002/j.1538-7305.1985.tb00450.x
Abstract
A major objective of the TAT-8 submarine cable development program is the reliability assurance of its critical components. A relatively new device, the InGaAs photodiode, is used as the detection element in optical receivers and as the monitor of la...This publication has 6 references indexed in Scilit:
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