Systematic study of 3d transition metal-silicon interfaces by photoemission
- 31 March 1983
- journal article
- Published by Elsevier in Physica B+C
- Vol. 117-118, 843-845
- https://doi.org/10.1016/0378-4363(83)90670-8
Abstract
No abstract availableKeywords
This publication has 4 references indexed in Scilit:
- Structural morphology and electronic properties of the Si-Cr interfacePhysical Review B, 1982
- Si–Pd and Si–Pt interfacesJournal of Vacuum Science and Technology, 1980
- Microscopic Compound Formation at the Pd-Si(111) InterfacePhysical Review Letters, 1979
- Surface spectroscopy of Schottky-barrier formation on Si(111) 7 × 7: Photoemission studies of filled surface states and band bendingPhysical Review B, 1976