An Auger electron spectroscopy-secondary ion mass spectrometry study of layers of Cu-Ni and Ag-Au alloys modified by ion bombardment
- 1 November 1979
- journal article
- Published by Elsevier in Thin Solid Films
- Vol. 63 (2), 263-268
- https://doi.org/10.1016/0040-6090(79)90025-7
Abstract
No abstract availableKeywords
This publication has 8 references indexed in Scilit:
- An AES study of surface segregation of AgAu alloys with ion bombardment and annealingSurface Science, 1978
- Effects of enhanced diffusion on preferred sputtering of homogeneous alloy surfacesSurface Science, 1978
- Preferential sputtering of binary alloys with diffusion: The equilibrium distributionRadiation Effects, 1978
- In-depth profile of altered layers of copper-nickel alloys formed by sputteringSurface Science, 1977
- Determination of the surface versus bulk composition of silver-gold alloys by low energy ion scattering spectroscopySurface Science, 1976
- Search for preferential sputtering in Ag/Au alloysJournal of Vacuum Science and Technology, 1976
- Binary alloy surface compositions from bulk alloy thermodynamic dataSurface Science, 1974
- Quantitative auger analysis of copper-nickel alloy surfaces after argon ion bombardmentSurface Science, 1973