Scanning-tunneling optical microscopy: a theoretical macroscopic approach
- 1 May 1992
- journal article
- Published by Optica Publishing Group in Journal of the Optical Society of America A
- Vol. 9 (5), 732-739
- https://doi.org/10.1364/josaa.9.000732
Abstract
Optics InfoBase is the Optical Society's online library for flagship journals, partnered and copublished journals, and recent proceedings from OSA conferences.Keywords
This publication has 18 references indexed in Scilit:
- External and internal reflection near field microscopy: experiments and resultsApplied Optics, 1990
- Model for reflection near field optical microscopyApplied Optics, 1990
- Optical interaction between a dielectric tip and a nanometric lattice: implications for near-field microscopyJournal of the Optical Society of America B, 1990
- General principles of scanning tunneling optical microscopyOptics Letters, 1989
- Scanning tunneling optical microscopyOptics Communications, 1989
- New form of scanning optical microscopyPhysical Review B, 1989
- Near-field optical scanning microscopy in reflectionApplied Physics Letters, 1988
- Differential Laser Heterodyne MicrometrologyOptical Engineering, 1985
- Microscopy and pattern generation with scanned evanescent wavesApplied Optics, 1984
- Super-resolution Aperture Scanning MicroscopeNature, 1972