New Applications of X-Ray Standing-Wave Fields to Solid State Physics
- 25 October 1976
- journal article
- research article
- Published by American Physical Society (APS) in Physical Review Letters
- Vol. 37 (17), 1141-1145
- https://doi.org/10.1103/physrevlett.37.1141
Abstract
An x-ray standing-wave-field apparatus has been constructed that demonstrates an impurity atomic position resolution of ∼0.02 Å. The method is applied to the measurement of ion-implantation-induced lattice relaxation. It is pointed out that the method is also suited to determine surface impurity locations perpendicular to crystal surfaces.Keywords
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