Increase of low-frequency-noise-generating defects in today's CMOS and BiCMOS technologies
- 31 October 1989
- journal article
- Published by Elsevier in Materials Science and Engineering B
- Vol. 4 (1-4), 367-372
- https://doi.org/10.1016/0921-5107(89)90272-9
Abstract
No abstract availableKeywords
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