Effects of random MOSFET parameter fluctuations on total power consumption

Publisher Website

23 December 2002

conference paper
Published by Institute of Electrical and Electronics Engineers (IEEE)

https://doi.org/10.1109/lpe.1996.547514

Abstract

No abstract available

Keywords

This publication has 5 references indexed in Scilit:

Low power microelectronics: retrospect and prospect
Proceedings of the IEEE, 1995
Three-dimensional analytical subthreshold models for bulk MOSFETs
IEEE Transactions on Electron Devices, 1995
Experimental Study Of Threshold Voltage Fluctuations Using An 8k MOSFET's Array
Published by Institute of Electrical and Electronics Engineers (IEEE) ,1993
Effects of microscopic fluctuations in dopant distributions on MOSFET threshold voltage
IEEE Transactions on Electron Devices, 1992
The effect of randomness in the distribution of impurity atoms on FET thresholds
Applied Physics A, 1975

Cited by 8 articles