High-resolution Rutherford backscattering spectrometry of metal-silicon interfaces
- 3 March 1986
- journal article
- Published by Elsevier in Surface Science
- Vol. 168 (1-3), 701-712
- https://doi.org/10.1016/0039-6028(86)90902-7
Abstract
No abstract availableThis publication has 36 references indexed in Scilit:
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