Ion beam crystallography of metal-silicon interfaces: Pd-Si(111)
- 1 July 1982
- journal article
- Published by Elsevier in Thin Solid Films
- Vol. 93 (1-2), 151-159
- https://doi.org/10.1016/0040-6090(82)90100-6
Abstract
No abstract availableKeywords
This publication has 3 references indexed in Scilit:
- Angle resolved detection of charged particles with a novel type toroidal electrostatic analyserNuclear Instruments and Methods in Physics Research, 1982
- A Model on the Mechanism of Room Temperature Interfacial Intermixing Reaction in Various Metal‐Semiconductor Couples: What Triggers the Reaction?Journal of the Electrochemical Society, 1980
- Presence of critical Au-Film thickness for room temperature interfacial reaction between Au(film) and Si(crystal substrate)Solid State Communications, 1980