Measurements on Local Variations in Spacing and Orientation of the Lattice Plane of Silicon Single Crystals by X-Ray Double-Crystal Topography
- 1 November 1966
- journal article
- Published by IOP Publishing in Japanese Journal of Applied Physics
- Vol. 5 (11), 1047-1055
- https://doi.org/10.1143/jjap.5.1047
Abstract
No abstract availableKeywords
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