High-Resolution X-Ray-Diffraction Topography using Kβ Radiation
- 1 September 1967
- journal article
- research article
- Published by AIP Publishing in Journal of Applied Physics
- Vol. 38 (10), 4094-4096
- https://doi.org/10.1063/1.1709083
Abstract
No abstract availableThis publication has 4 references indexed in Scilit:
- Direct Observation of Imperfections in Semiconductor Crystals by Anomalous Transmission of X RaysJournal of Applied Physics, 1962
- Variant in Technique for A. R. Lang's X-Ray Diffraction TopographyJournal of Applied Physics, 1961
- The projection topograph: a new method in X-ray diffraction microradiographyActa Crystallographica, 1959
- Relative Intensities and Transition Probabilities of the-Series Lines of the Elements 24 to 52 by the Ionization Chamber MethodPhysical Review B, 1933