Thickness of the Helium II Film
- 1 October 1949
- journal article
- letter
- Published by Springer Nature in Nature
- Vol. 164 (4172), 660-661
- https://doi.org/10.1038/164660a0
Abstract
No abstract availableKeywords
This publication has 5 references indexed in Scilit:
- IV. A contribution to the theory of liquid helium IIJournal of Computers in Education, 1949
- The Ellipsometer, an Apparatus to Measure Thicknesses of Thin Surface FilmsReview of Scientific Instruments, 1945
- Properties of liquid helium IIPhysica, 1941
- Comment on the Elastic Constants of Alpha-QuartzPhysical Review B, 1941
- Further Experiments on Liquid Helium IINature, 1938