Ion beam-treated silicon probes operated in transmission and cross-polarized reflection mode near-infrared scanning near-field optical microscopy (NIR-SNOM)
- 1 May 1999
- journal article
- research article
- Published by Wiley in Surface and Interface Analysis
- Vol. 27 (5-6), 486-490
- https://doi.org/10.1002/(sici)1096-9918(199905/06)27:5/6<486::aid-sia498>3.0.co;2-6
Abstract
No abstract availableKeywords
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