Electron spectroscopy for bulk and surface microscopy and microanalysis
- 29 February 1980
- journal article
- Published by Elsevier in Materials Science and Engineering
- Vol. 42, 45-48
- https://doi.org/10.1016/0025-5416(80)90008-7
Abstract
No abstract availableThis publication has 4 references indexed in Scilit:
- Microanalyse par radiographie X à balayage et fluorescence X : une conception nouvelleJournal de Physique Lettres, 1979
- X-ray analysis by electron spectroscopyJournal de Physique Lettres, 1977
- Microanalyse et microscopie photoélectroniques X: principe et performances prévisiblesRevue de Physique Appliquée, 1975
- Electron Probe MicroanalysisPublished by Elsevier ,1960