The Effect of Electron Multiplier Afterpulses on Atom-Probe FIM Identification of Metal-Compound Ions
- 1 January 1973
- journal article
- research article
- Published by AIP Publishing in Review of Scientific Instruments
- Vol. 44 (1), 84-86
- https://doi.org/10.1063/1.1685970
Abstract
No abstract availableThis publication has 8 references indexed in Scilit:
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- Mass spectrometric analysis of low temperature field evaporationSurface Science, 1968