Carbon K edge spectroscopy of internal interface and defect states of chemical vapor deposited diamond films
- 6 January 1992
- journal article
- research article
- Published by AIP Publishing in Applied Physics Letters
- Vol. 60 (1), 135-137
- https://doi.org/10.1063/1.107349
Abstract
We have made carbon K edge reflectivity and absorption measurements using synchrotron radiation on diamond crystals and chemical vapor deposited diamond films to determine their electronic structures. Our spectra of diamond films show that both sp2 and sp3 bonded carbon atoms are formed during initial nucleation and growth. Transmission spectra of a diamond film with 30 nm diameter cystallites show striking features below the carbon sp3 K edge due to internal interface states and/or defects. We compare these absorption features to x‐ray absorption spectra of clean diamond (111) surface, graphite, and hydrocarbon gases to understand surface chemistry involved in the deposition process.Keywords
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