A theoretical model for the Inverse Scanning Tunneling Optical Microscope (ISTOM)
- 15 February 1995
- journal article
- Published by Elsevier in Optics Communications
- Vol. 114 (5-6), 470-480
- https://doi.org/10.1016/0030-4018(94)00555-9
Abstract
No abstract availableKeywords
This publication has 20 references indexed in Scilit:
- Combined aperture SNOM/PSTM: best of both worlds?Ultramicroscopy, 1995
- Near-field, far-field and imaging properties of the 2D aperture SNOMUltramicroscopy, 1995
- Imaging of submicron index variations by scanning optical tunnelingJournal of Vacuum Science & Technology B: Microelectronics and Nanometer Structures, 1992
- Combined shear force and near-field scanning optical microscopyApplied Physics Letters, 1992
- Breaking the Diffraction Barrier: Optical Microscopy on a Nanometric ScaleScience, 1991
- Model for reflection near field optical microscopyApplied Optics, 1990
- Optical interaction between a dielectric tip and a nanometric lattice: implications for near-field microscopyJournal of the Optical Society of America B, 1990
- Scanning tunneling optical microscopyOptics Communications, 1989
- New form of scanning optical microscopyPhysical Review B, 1989
- Near-field diffraction by a slit: implications for superresolution microscopyApplied Optics, 1986